Wavelength Range | 190 to 900 nm |
Wavelength Accuracy | £ ±0.5 nm |
Wavelength Repeatability | £ 0.3 nm (single direction) |
Spectrum Bandwidth | 0.2 nm, 0.4 nm, 0.7nm, 1.4 nm, 2.4 nm, 5.0 nm |
Resolution | <40% |
Wavelength range | 190 to 900 nm |
Spectral bandwidth | 0.1, 0.2, 0.4, 1.0 and 2.0 nm |
Accuracy of the wavelength | ±0.15 nm |
Receptivity of the wavelength | ≤0.04 nm |
Baseline stability | ≤0.002A/30 min (Cu) |
Spectrum Bandwidth | 2 nm |
Wavelength Range | 190 to 1100 nm |
Monochromatic Type | Czerny-Turner |
Grating | 1600 lines/mm |
Detector | Silicon Photocell |
Spectrum Bandwidth | 0.5 nm, 1nm, 2 nm, 4 nm, 5 nm |
Wavelength Range | 190 to 1100 nm |
Monochromatic Type | Czerny-Turner |
Grating | 1600 lines/mm |
Detector | Silicon Photocell |
Monochromatic type | Czerny turner |
Focal length | 160 mm |
Wavelength Range | 190 to 1100 nm |
Band Width | 1.8 nm |
Wavelength Accuracy | ±0.3 nm |
Monochromatic type | Czerny turner |
Focal length | 160 mm |
Wavelength Range | 190 to 1100nm |
Band Width | 2 nm |
Wavelength Accuracy | ±0.3 nm |
Exciting Optical Filters | Interface optical filter (10 nm bandwidth) |
Wavelength | 365 nm |
Emission Monochromatic | C-T diffraction grating (EM 200 to 900 nm ) |
Wavelength Accuracy | ±1 nm |
Wavelength Repeatability | ≤0.5 nm |
Light Path | 1mm |
sample Volume | 1 to 2μL |
Detection Range | 190 to 850 nm |
Wavelength Range | 190 to 1100 nm |
Wavelength Accuracy | ± 1nm |
Optical Path | 1/0.5/0.05 mm automatic conversion |
Optical Range | 190 to 1100 nm |
Sample Volume | 0.3 to 2.0 μl |
Light Source | Long-life Xenon lamp |
Detector | 3864 linear CCD array |
Wavelength scanning Range | 190 to 850 nm |
Wavelength Accuracy | ±1 nm |
Optical Path | 1/0.5/0.05 mm automatic conversion |
Optical Range | 190 to 1100 nm |
Sample Volume | 0.3 to 2.0 μl |
Wavelength Range | 190 to 850 nm |
Wavelength Accuracy | ± 1 nm |
Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
Repeatability | <± 0.5 nm |
Light Path | 1 mm, 0.05 mm (optical path automatic conversion) |
Wavelength Range | 190 to 850 nm |
Wavelength Accuracy | ± 1nm |
Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
Repeatability | <± 0.5 nm |
Light Path | 1 mm, 0.05 mm (optical path automatic conversion) |
Wavelength Range | 900 to 1700 nm |
Wavelength Accuracy | ±1 nm |
Wavelength Reproducibility | ≤1 nm |
Wavelength Scanning Interval Absorbance | 1 nm, 4 nm, 8 nm, 16 nm |
Reproducibility S/N | 0.002 A (at 0.4 A) |
Photometry | Split Beam |
Monochromatic Type | Czerny-Turner |
Focal Length | 160 mm |
Grating | 1200 lines/mm |
Detector | Silicon Photocell |
Photometry | Split Beam |
Monochromatic Type | Czerny-Turner |
Focal Length | 160 mm |
Grating | 1200 lines/mm |
Detector | Silicon Photocell |
Photometry | Split Beam |
Monochromatic Type | Czerny-Turner |
Focal Length | 160 mm |
Grating | 1200 lines/mm |
Detector | Silicon Photocell |
Photometry | Split Beam |
Monochromatic Type | Czerny-Turner |
Focal Length | 160 mm |
Grating | 1200 lines/mm |
Detector | Silicon Photocell |
Photometry | Single Beam |
Monochromatic Type | Czerny-Turner |
Focal Length | 160 mm |
Grating | 1200 lines/mm |
Detector | Silicon Photocell |
Photometry | Single Beam |
Monochromatic Type | Czerny-Turner |
Focal Length | 160 mm |
Grating | 1200 lines/mm |
Detector | Silicon Photocell |
Photometry | Single Beam |
Monochromatic Type | Czerny-Turner |
Focal Length | 160 mm |
Grating | 1200 lines/mm |
Detector | Silicon Photocell |
Photometry | Single Beam |
Monochromatic Type | Czerny-Turner |
Focal Length | 160 mm |
Grating | 1200 lines/mm |
Detector | Silicon Photocell |
Photometry | Single beam |
Monochromatic Type | Littrow |
Focal Length | 160 mm |
Wavelength Setting | Manual Turn Knob |
Wavelength Range | 325 to1000 nm |
Analysis Principle | Energy-dispersive X-ray fluorescence analysis |
Element Measuring Range | Any element from Na(11)-U(92) |
Minimum Measuring Limit | Cd/Hg/Br/Cr/Pb≤2 ppm |
Sample Shape | Arbitrary size, any irregular shape |
Sample Type | Plastic/metal/film/powder/liquid etc. |